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  2. Lichtenberg figure - Wikipedia

    en.wikipedia.org/wiki/Lichtenberg_figure

    A Lichtenberg figure (German Lichtenberg-Figuren ), or Lichtenberg dust figure, is a branching electric discharge that sometimes appears on the surface or in the interior of insulating materials. Lichtenberg figures are often associated with the progressive deterioration of high voltage components and equipment.

  3. Jacquard machine - Wikipedia

    en.wikipedia.org/wiki/Jacquard_machine

    The machine was controlled by a "chain of cards"; a number of punched cards laced together into a continuous sequence. Multiple rows of holes were punched on each card, with one complete card corresponding to one row of the design. Both the Jacquard process and the necessary loom attachment are named after their inventor.

  4. Printed circuit board - Wikipedia

    en.wikipedia.org/wiki/Printed_circuit_board

    Printed circuit board of a DVD player. Part of a 1984 Sinclair ZX Spectrum computer board, a printed circuit board, showing the conductive traces, the through-hole paths to the other surface, and some electronic components mounted using through-hole mounting. A printed circuit board ( PCB ), also called printed wiring board ( PWB ), is a medium ...

  5. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Use and manufacture [ edit] A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .

  6. Timeline of United States inventions (1890–1945) - Wikipedia

    en.wikipedia.org/wiki/Timeline_of_United_States...

    Timeline of United States inventions (1890–1945) Robert H. Goddard (1882–1945), the American physicist and inventor who built and launched the world's first liquid-propellant rocket on March 16, 1926. [1] Goddard held 214 patents for his inventions and pioneering innovations in liquid-propelled, guided, and multi-stage rockets.

  7. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after the back end of line (BEOL) process is finished. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them.